Titlebook: Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Co; Frank Ohnhäuser Book 2015 Springer-V

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DIGE Analysis of Clinical Specimense external circuitry is also required for a proper test solution. The principles of the different test methods are explained in Sect. .. The performance needs to be optimized for noise and repeatability. The performance of the production test has to be guaranteed and monitored. A quality flow is therefore described in Sect. ..

反感

Advanced SAR ADC Design, described in Sect. .. In a next step, trim solutions for these ADCs were evaluated. A purely digital trim solution is proposed in Sect. . followed by an INL-trim method in Sect. .. A novel method to measure capacitive matching, which is required for the trim algorithm, will further reduce the production costs. It is discussed in Sect. ..

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GEAR

Continuous-Time Delta-Sigma ADCs,ging the clock frequency. Furthermore, the clock jitter only affects the system noise hardly. The input signal will be sampled at a wrong point of time. However, due to the oversampling, the input frequencies are low anyhow, where noise based on clock jitter can normally be neglected.

Expiration

Digital-to-Analog Converters,e controlling element. The system performance will then fully rely on the DAC and the absolute values such as INL, offset or gain are important. If they are used inside a control loop, which will increment or decrement the DAC value, then equal step size is required, which is reflected in the DNL.

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