| 期刊全称 | Analog IC Reliability in Nanometer CMOS | | 影响因子2023 | Elie Maricau,Georges Gielen | | 视频video | http://file.papertrans.cn/156/155851/155851.mp4 | | 发行地址 | Enables readers to understand long-term reliability of an integrated circuit.Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes.Provides overview of models f | | 学科分类 | Analog Circuits and Signal Processing | | 图书封面 |  | | 影响因子 | .This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. .The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. . | | Pindex | Book 2013 |
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