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Titlebook: Ageing of Integrated Circuits; Causes, Effects and Basel Halak Book 2020 Springer Nature Switzerland AG 2020 Analog IC Reliability.Aging E

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期刊全称Ageing of Integrated Circuits
期刊简称Causes, Effects and
影响因子2023Basel Halak
视频video
发行地址Describes in detail the physical mechanisms of CMOS ageing.Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits.Presents state-of-the art s
图书封面Titlebook: Ageing of Integrated Circuits; Causes, Effects and  Basel Halak Book 2020 Springer Nature Switzerland AG 2020 Analog IC Reliability.Aging E
影响因子.This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.  .
Pindex Book 2020
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Critique and Its Postnational Aftermath The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error
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Ageing Mitigation Techniques for SRAM Memories The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error
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