Titlebook: Advances in Fabrication and Investigation of Nanomaterials for Industrial Applications ; Sivashankar Krishnamoorthy,Krzysztof (Kris) Iniew

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https://doi.org/10.1007/978-3-8351-9220-1try (SE), and high-resolution synchrotron extended x-ray absorption spectroscopy (HR-SXAS) data for comprehending film thickness, optical, structural, and phonon traits of several epitaxially grown II–VI/III–V epilayers and superlattices (SLs). The structural and electronic properties are acquired b

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