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Titlebook: Advanced Gate Stacks for High-Mobility Semiconductors; Athanasios Dimoulas,Evgeni Gusev,Marc Heyns Book 2007 Springer-Verlag Berlin Heidel

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发表于 2025-3-21 17:27:24 | 显示全部楼层 |阅读模式
期刊全称Advanced Gate Stacks for High-Mobility Semiconductors
影响因子2023Athanasios Dimoulas,Evgeni Gusev,Marc Heyns
视频videohttp://file.papertrans.cn/146/145619/145619.mp4
发行地址Comprehensive monograph on gate stacks in semiconductor technology.Covers the major latest developments and basics.A reference work for researchers, engineers and graduate students alike.Includes supp
学科分类Springer Series in Advanced Microelectronics
图书封面Titlebook: Advanced Gate Stacks for High-Mobility Semiconductors;  Athanasios Dimoulas,Evgeni Gusev,Marc Heyns Book 2007 Springer-Verlag Berlin Heidel
影响因子.Will nanoelectronic devices continue to scale according to Moore’s law? At this moment, there is no easy answer since gate scaling is rapidly emerging as a serious roadblock for the evolution of CMOS technology. Channel engineering based on high-mobility semiconductor materials (e.g. strained Si, alternative orientation substrates, Ge or III-V compounds) could help overcome the obstacles since they offer performance enhancement. There are several concerns though. Do we know how to make complex engineered substrates (e.g. Germanium-on-Insulator)? Which are the best interface passivation methodologies and (high-k) gate dielectrics on Ge and III-V compounds? Can we process these materials in short channel transistors using flows, toolsets and know how similar to that in Si technology? How do these materials and devices behave at the nanoscale? The reader will get a clear view of what has been done so far, what is the state-of-the-art and which are the main challenges ahead before we come any close to a viable Ge and III-V MOS technology..
Pindex Book 2007
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Strained-Si CMOS Technology,. Die Praktiker werden dazu angeregt, sich mit der Grundlage und dem Zustandekommen ihrer Urteile auseinanderzusetzen und diese kritisch zu hinterfragen. Ziel ist eine kompetente Bewältigung der diagnostischen Aufgaben, die sich im Rahmen der Personalauswahl und -beurteilung stellen..978-3-540-23717-4978-3-540-68658-3
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https://doi.org/10.1007/978-3-663-11981-4 time achieved by a single crystal oxide. Various GaAs metal-oxide-semiconductor field-effect-transistors (MOSFETs) and their device performance are reviewed. The mechanism of Fermi-level unpinning in ALD-Al.O. on InGaAs was studied and understood. The epitaxy and the interfaces of Gd.O. on GaN were
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