Titlebook: Advanced Computing in Electron Microscopy; Earl J. Kirkland Book 20102nd edition Springer Science+Business Media, LLC 2010 computer simula

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Theory of Calculation of Images of Thick Specimens,978-3-663-15849-3

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Introduction,nd Leerverweis; ineins Erfüllung dessen zu sein, worauf sie verweist, und Erfüllung von etwas, das kein Sein zu haben scheint, macht den flüchtigen Eindruck ihres Gesetztseins aus und ihres Schwebens. Um Aufklärung des ästhetischen Scheins, des »Hauchs« (Adorno 1973: 195). über dem, was ästhetisch wahrgenommen wird, geht es in dieser Untersuchung.

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The Fourier Projection Theorem,s situations, for analyzing decisions from the perspective of values and principles. With insights on topics such as, how to gain respect at work, how to cultivate an optimistic outlook and how to shrug off failure, it offers timeless advice for managers that can be applied for their personal and pr

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Atomic Potentials and Scattering Factors,mited to the history of Indian thought or Indology. Modern exponents of Advaita Vedanta are numerous. With a few notable exceptions, however, most modern authors of Vedanta try to expound and modernise the Advaita system from either a speculative and personal point of view or from a superficial viewpoint of K978-94-009-9824-7978-94-009-9822-3

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Earl J. KirklandThis book features numerical computation of electron microscopy images as well as multislice methods.High resolution CTEM and STEM image interpretation are included in the text.This newly updated seco

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978-1-4899-9509-4Springer Science+Business Media, LLC 2010