Titlebook: A Unified Approach for Timing Verification and Delay Fault Testing; Mukund Sivaraman,Andrzej J. Strojwas Book 1998 Springer Science+Busine

偏差

书目名称A Unified Approach for Timing Verification and Delay Fault Testing影响因子(影响力)




书目名称A Unified Approach for Timing Verification and Delay Fault Testing影响因子(影响力)学科排名




书目名称A Unified Approach for Timing Verification and Delay Fault Testing网络公开度




书目名称A Unified Approach for Timing Verification and Delay Fault Testing网络公开度学科排名




书目名称A Unified Approach for Timing Verification and Delay Fault Testing被引频次




书目名称A Unified Approach for Timing Verification and Delay Fault Testing被引频次学科排名




书目名称A Unified Approach for Timing Verification and Delay Fault Testing年度引用




书目名称A Unified Approach for Timing Verification and Delay Fault Testing年度引用学科排名




书目名称A Unified Approach for Timing Verification and Delay Fault Testing读者反馈




书目名称A Unified Approach for Timing Verification and Delay Fault Testing读者反馈学科排名

诱惑

intrigue

HEPA-filter

Hans Ramløv,Dennis Steven Friisput stabilizes to its final logic value. In other words, the maximum of the primitive PDF delays is a valid bound for the maximum circuit delay. We elaborate on this in Section 4.1, and prove that this in fact is exactly equal to the maximum circuit delay under the floating mode of operation. We the

不舒服

FLIT

https://doi.org/10.1007/978-1-4614-3840-3elay testing, it is therefore judicious to select a manageable set of test patterns which test each fabricated chip for the presence of delay faults. If a fabricated chip passes a set of delay tests, the confidence one has in the absence of delay faults in the chip is a measure of the effectiveness

Ccu106

有斑点

tenosynovitis

escalate

http://image.papertrans.cn/a/image/142545.jpg