| 期刊全称 | A Designer’s Guide to Built-In Self-Test | | 影响因子2023 | Charles E. Stroud | | 视频video | http://file.papertrans.cn/141/140643/140643.mp4 | | 学科分类 | Frontiers in Electronic Testing | | 图书封面 |  | | 影响因子 | A recent technological advance is the art of designing circuitsto test themselves, referred to as a Built-In Self-Test (BIST). Thisidea was first proposed around 1980 and has grown to become one of themost important testing techniques at the current time, as well as forthe future. This book is written from a designer‘s perspective anddescribes the major BIST approaches that have been proposed andimplemented since 1980, along with their advantages and limitations.The BIST approaches include the Built-In Logic Block Observer,pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST,BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signalBIST, and the integration of BIST with concurrent fault detectiontechniques for on-line testing. Particular attention is paid tosystem-level use of BIST in order to maximize the benefits of BISTthrough reduced testing time and cost as well as high diagnosticresolution. The author spent 15 years as a designer at Bell Labs wherehe designed over 20 production VLSI devices and 3 production circuitboards. Sixteen of the VLSI devices contained BIST of various typesfor regular structures and general sequential logic, including thefirst BIS | | Pindex | Book 2002 |
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