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SCIE期刊IEEE Design & Test 2024/2025影响因子:1.909 (IEEE DES TEST) (2168-2356). (COMPUTER SCIENCE, HARDWARE & ARCHITECTURE)(计

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Submitted on: 17 March 2007. Revised on: 26 April 2007. Accepted on: 24 June 2007. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Submitted on: 21 May 2024. Revised on: 25 July 2024. Accepted on: 30 August 2024. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Submitted on: 02 December 2020. Revised on: 09 February 2021. Accepted on: 27 March 2021. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Submitted on: 03 March 2002. Revised on: 02 June 2002. Accepted on: 20 July 2002. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Submitted on: 27 July 2016. Revised on: 11 September 2016. Accepted on: 10 October 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Submitted on: 23 September 2011. Revised on: 30 October 2011. Accepted on: 22 November 2011. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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