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Titlebook: X-Ray Scattering from Soft-Matter Thin Films; Materials Science an Metin Tolan Book 1999 Springer-Verlag Berlin Heidelberg 1999 materials s

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书目名称X-Ray Scattering from Soft-Matter Thin Films
副标题Materials Science an
编辑Metin Tolan
视频video
概述Comprehensive introduction to the state of the art of this rapidly growing research field.
丛书名称Springer Tracts in Modern Physics
图书封面Titlebook: X-Ray Scattering from Soft-Matter Thin Films; Materials Science an Metin Tolan Book 1999 Springer-Verlag Berlin Heidelberg 1999 materials s
描述The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
出版日期Book 1999
关键词materials science; polymer; scattering; surface; thin films
版次1
doihttps://doi.org/10.1007/BFb0112834
isbn_softcover978-3-662-14218-9
isbn_ebook978-3-540-49525-3Series ISSN 0081-3869 Series E-ISSN 1615-0430
issn_series 0081-3869
copyrightSpringer-Verlag Berlin Heidelberg 1999
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Springer Tracts in Modern Physicshttp://image.papertrans.cn/xyz/image/1060047.jpg
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978-3-662-14218-9Springer-Verlag Berlin Heidelberg 1999
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X-Ray Scattering from Soft-Matter Thin Films978-3-540-49525-3Series ISSN 0081-3869 Series E-ISSN 1615-0430
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0081-3869 -matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.978-3-662-14218-9978-3-540-49525-3Series ISSN 0081-3869 Series E-ISSN 1615-0430
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