| 书目名称 | X-Ray Absorption Spectroscopy of Semiconductors |
| 编辑 | Claudia S. Schnohr,Mark C. Ridgway |
| 视频video | |
| 概述 | Gives a complete survey of the current state of the art of X-ray absorption spectroscopy of semiconductors.Provides an overview of a wide range of semiconductor materials.Displays comprehensive summar |
| 丛书名称 | Springer Series in Optical Sciences |
| 图书封面 |  |
| 描述 | X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate t |
| 出版日期 | Book 2015 |
| 关键词 | Amorphous Semiconductors; Disordered Semiconductors; Nanoparticles in Semiconductors; Optical Propertie |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-662-44362-0 |
| isbn_softcover | 978-3-662-52212-7 |
| isbn_ebook | 978-3-662-44362-0Series ISSN 0342-4111 Series E-ISSN 1556-1534 |
| issn_series | 0342-4111 |
| copyright | Springer-Verlag Berlin Heidelberg 2015 |
发表于 2025-3-21 17:04:19
