Titlebook: Wafer-Level Integrated Systems; Implementation Issue Stuart K. Tewksbury Book 1989 Kluwer Academic Publishers 1989 Flip-Flop.Generator.Prog

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Function-Specific Testing,tion, routing and response analysis of test vectors can be implemented using the general purpose testing structures (e.g. scan path testing, response compression, TMR, etc.) discussed in the previous chapter. The techniques discussed below begin with testing of memory arrays, where the contents of e

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Function-Specific Testing,tion, routing and response analysis of test vectors can be implemented using the general purpose testing structures (e.g. scan path testing, response compression, TMR, etc.) discussed in the previous chapter. The techniques discussed below begin with testing of memory arrays, where the contents of e

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Formal Models of Reconfiguration,low movement through the array becomes limited by the longest delay path. For example, the uniform length, nearest neighbor interconnections of an ideal systolic array provide much of the impetus for systolic array designs in the first place. Introduction of reconfiguration schemes, which introduce

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