Agitated 发表于 2025-3-21 17:31:13
书目名称Defect Complexes in Semiconductor Structures影响因子(影响力)<br> http://impactfactor.cn/if/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures影响因子(影响力)学科排名<br> http://impactfactor.cn/ifr/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures网络公开度<br> http://impactfactor.cn/at/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures网络公开度学科排名<br> http://impactfactor.cn/atr/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures被引频次<br> http://impactfactor.cn/tc/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures被引频次学科排名<br> http://impactfactor.cn/tcr/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures年度引用<br> http://impactfactor.cn/ii/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures年度引用学科排名<br> http://impactfactor.cn/iir/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures读者反馈<br> http://impactfactor.cn/5y/?ISSN=BK0264711<br><br> <br><br>书目名称Defect Complexes in Semiconductor Structures读者反馈学科排名<br> http://impactfactor.cn/5yr/?ISSN=BK0264711<br><br> <br><br>Canyon 发表于 2025-3-21 21:18:42
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Photoluminescence of defect complexes in silicon,he photoluminescence (PL) technique: (i) Defects incorporating transition metal ions, (ii) defects related with oxygen and carbon doping the silicon and (iii) dislocation induced defects. We shall briefly discuss the state of the art from the PL point of view as well as present new data for all thre哄骗 发表于 2025-3-22 10:04:49
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Low frequency current oscillations due to electron retrapping by the AsGa antisite defect in GaAs,ting GaAs for the first time. These oscillations were found at DC electric fields above 500 Vcm., about one order of magnitude below the electric-field threshold for Gunn oscillations. The activation energy of the oscillation frequency was found to be 0.8 eV corresponding to the dominant electron trIniquitous 发表于 2025-3-22 23:56:25
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Montserrat Corbera,Jaume Llibrellows quantitative calculations. The method is particularly powerful for classes of complexes such as aggregates of identical point defects when the electronic structure of the primary point defect is known and for defects in wide-gap materials. lie review results obtained for multivacancies in Si and for several defects in SiO..