离开 发表于 2025-3-26 21:58:43

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缩短 发表于 2025-3-27 02:33:25

978-94-010-5203-0Springer Science+Business Media Dordrecht 1992

珠宝 发表于 2025-3-27 06:01:26

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法官 发表于 2025-3-27 09:55:58

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A保存的 发表于 2025-3-27 17:14:55

nce. Under certain excitation conditions strong interwell effects appear, in spite of the thick barriers. These effects seem to be attributable to interface and near-interface defects located in the MBE-grown AlGaAs barriers.

Chronic 发表于 2025-3-27 20:04:43

The History of Rope Transportation, (DLTS) and current-voltage (IV) measurements. For both undecorated and Fe-decorated stacking faults similar deep level spectra were found with a dominant level at Ev+0.5 eV. For diodes with decorated stacking faults the IV-measurements reveal a drastic enhancement of the reverse current which correlates with the Fe concentration.

FLOAT 发表于 2025-3-28 00:07:38

Scaling for Convective Boundary Layers gradient. This defect configuration shows persistent photoionisation and it is associated with the so-called “DX-center”. The time constant of the relaxation from the substitutional donor-site to the DX-center defect site is measured.

GULLY 发表于 2025-3-28 03:19:29

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Antimicrobial 发表于 2025-3-28 07:12:32

Effects of Near-Interface Defects on the Optical Properties of MBE Grown GaAs/AlGaAs Layersnce. Under certain excitation conditions strong interwell effects appear, in spite of the thick barriers. These effects seem to be attributable to interface and near-interface defects located in the MBE-grown AlGaAs barriers.

打包 发表于 2025-3-28 11:58:16

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查看完整版本: Titlebook: Crucial Issues in Semiconductor Materials and Processing Technologies; S. Coffa,F. Priolo,J. M. Poate Book 1992 Springer Science+Business