TUMOR
发表于 2025-3-21 17:30:35
书目名称Analog IC Reliability in Nanometer CMOS影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0155851<br><br> <br><br>书目名称Analog IC Reliability in Nanometer CMOS读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0155851<br><br> <br><br>
删减
发表于 2025-3-21 22:17:42
Elie Maricau,Georges GielenEnables readers to understand long-term reliability of an integrated circuit.Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes.Provides overview of models f
lesion
发表于 2025-3-22 01:34:19
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Ingredient
发表于 2025-3-22 04:39:41
Introduction,or aging on analog integrated circuits (IC) in a nanometer complementary metal-oxide-semiconductor (CMOS) technology. The first chapter of this work introduces the problem studied and the major subjects addressed in this book.
Seminar
发表于 2025-3-22 10:25:18
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Irrigate
发表于 2025-3-22 14:14:35
Analog IC Reliability in Nanometer CMOS978-1-4614-6163-0Series ISSN 1872-082X Series E-ISSN 2197-1854
bioavailability
发表于 2025-3-22 17:11:57
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jocular
发表于 2025-3-22 22:25:21
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单挑
发表于 2025-3-23 04:04:18
https://doi.org/10.1007/978-1-4614-6163-0Analog Circuits and Signal Processing; Analog Integrated Circuits; Failure-resilient Analog Circuit De
Hypomania
发表于 2025-3-23 08:52:54
978-1-4899-8630-6Springer Science+Business Media New York 2013