ARIA 发表于 2025-3-27 00:38:41

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羊栏 发表于 2025-3-27 03:18:28

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commensurate 发表于 2025-3-27 07:49:06

https://doi.org/10.1007/978-3-322-91158-2es allowed in the technology process. The latter are typically defined as the stress voltage for which the drain current or threshold voltage does not exceed a given reliability margin (e.g. . or . mV after . years) (also see Sect. 1.5).

转向 发表于 2025-3-27 13:00:45

V. V. Toropov,F. Yoshida,E. van der Giessenome due to COVID-19 restrictions, and difficulty accessing daily supplies during the lockdown affected the residents’ risk assessment and evacuation decision-making negatively. Insights into these aspects are expected to contribute to a better understanding of evacuation behavior during double disas

轻触 发表于 2025-3-27 16:20:29

Ramachandran Ishwarya,Govindan Tamilmani,Rengarajan Jayakumar main categories of information systems flexibility impacts on the information systems strategy implementation. Our study contributes to the new information technology adoption literature and provides implications for information technology adoption in practice.

过渡时期 发表于 2025-3-27 20:12:04

Die Reibung von Nickel auf Nickel im Vakuumtstellen abzuscheren. Diese Haftstellen sind nicht aufzufassen als die Berührungsstellen zweier, an sich selbständiger Körper; vielmehr fließen hier beide Körper zu einem einheitlichen Ganzen zusammen, es hat Kaltverschweißung stattgefunden. Bei der „Reibung“ werden diese Schweißstellen immer wieder

宴会 发表于 2025-3-28 01:23:01

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NIB 发表于 2025-3-28 03:59:47

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MAL 发表于 2025-3-28 06:49:06

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查看完整版本: Titlebook: Analog IC Reliability in Nanometer CMOS; Elie Maricau,Georges Gielen Book 2013 Springer Science+Business Media New York 2013 Analog Circui