是他笨
发表于 2025-3-23 10:02:11
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宣誓书
发表于 2025-3-23 15:24:32
Heribert Meffert,Ralf Birkelbach for semiconductors 2011). This trend is driven by a seemingly unending demand for ever-better performance and by fierce global competition. The steady CMOS technology downscaling is needed to meet requirements on speed, complexity, circuit density, power consumption and ultimately cost required by
apiary
发表于 2025-3-23 21:22:55
Heribert Meffert,Ralf Birkelbacht performance at design time. This results in huge savings in development costs and enables a designer to maximize the performance of his or her circuit in a particular technology. Over time, computer-aided design (CAD) software has become more complex and more and more aspects related to IC develop
丧失
发表于 2025-3-23 23:06:12
https://doi.org/10.1007/978-3-322-91158-2implementation of a reliability simulation framework in each of the major commercial SPICE simulators, there are still a lot of deficiencies remaining (also see Sect. 4.4). Especially with the evolution to ever-smaller CMOS devices, statistical effects resulting from process variations and stochasti
BLOT
发表于 2025-3-24 05:04:50
https://doi.org/10.1007/978-3-322-91158-2, aging effects become more important for circuits integrated in sub-45 nm technologies (see Chap. 2). To guarantee circuit reliability over a product’s lifetime, a foundry typically performs accelerated stress measurements on individual devices and calculates the maximum transistor operating voltag
顽固
发表于 2025-3-24 06:38:46
Heribert Meffert,Ralf Birkelbachistor aging effects have been studied and compact models for each important effect have been developed. Also, a circuit reliability simulation flow has been proposed. Finally, the flow has been applied to a set of analog circuits and the impact of aging has been studied.
Dedication
发表于 2025-3-24 11:50:20
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烦扰
发表于 2025-3-24 15:23:14
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阶层
发表于 2025-3-24 20:23:39
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特征
发表于 2025-3-25 02:39:36
Analog IC Reliability Simulation,implementation of a reliability simulation framework in each of the major commercial SPICE simulators, there are still a lot of deficiencies remaining (also see Sect. 4.4). Especially with the evolution to ever-smaller CMOS devices, statistical effects resulting from process variations and stochasti