| 书目名称 | VLSI-SoC: Design for Reliability, Security, and Low Power | | 副标题 | 23rd IFIP WG 10.5/IE | | 编辑 | Youngsoo Shin,Chi Ying Tsui,Ricardo Reis | | 视频video | | | 概述 | Includes supplementary material: | | 丛书名称 | IFIP Advances in Information and Communication Technology | | 图书封面 |  | | 描述 | This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems. | | 出版日期 | Conference proceedings 2016 | | 关键词 | chip integration; computer architecture; computer-aided design (CAD); field-programmable gate array (FP | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-319-46097-0 | | isbn_softcover | 978-3-319-83440-5 | | isbn_ebook | 978-3-319-46097-0Series ISSN 1868-4238 Series E-ISSN 1868-422X | | issn_series | 1868-4238 | | copyright | IFIP International Federation for Information Processing 2016 |
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发表于 2025-3-21 19:35:50
