| 书目名称 | Thermal Conductivity Measurements in Atomically Thin Materials and Devices |
| 编辑 | T. Serkan Kasirga |
| 视频video | |
| 概述 | Highlights the use of materials with atomically thin layers in electronics and optoelectronic devices.Discusses the thermal performance of materials such as graphene and transition metal dichalcogenid |
| 丛书名称 | SpringerBriefs in Applied Sciences and Technology |
| 图书封面 |  |
| 描述 | .This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. . |
| 出版日期 | Book 2020 |
| 关键词 | Van Der Waals Stacking; Atomically Thin Materials; Nanosheets; Photothermal Effects; Thermal Conductivit |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-981-15-5348-6 |
| isbn_softcover | 978-981-15-5347-9 |
| isbn_ebook | 978-981-15-5348-6Series ISSN 2191-530X Series E-ISSN 2191-5318 |
| issn_series | 2191-530X |
| copyright | The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2020 |
发表于 2025-3-21 16:33:14
