Titlebook: Surfaces and Interfaces II; Physical and Mechani John J. Burke (Staff Scientist),Norman L. Reed (As Book 1968 Syracuse University Press Syr

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M. L. Williams,K. L. DeVriesen tip and sample. All these new microscopies have the characteristic that their resolution is not determined by any wavelength that is used for the interaction as in conventional microscopy (the so called Abbe limit [6.2]) but rather by the size of the interacting probe that hovers over the sample

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ver. A displacement sensor then measures deflections as small as 10−2 Â. The first displacement sensor proposed by .et al. was based on electron tunneling. Later, different sensors based on optical interferometry, beam deflection or capacitance measurements were introduced. From the beginning it was

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N. S. Stoloff. A displacement sensor then measures deflections as small as 10. Å. The first displacement sensor proposed by . et al. was based on electron tunneling. Later, different sensors based on optical interferometry, beam deflection or capacitance measurements were introduced. From the beginning it was ev

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K. T. Austsliding friction without wear [11.3]. This success has been made possible by an increasing sophistication in the characterization of interfaces, from the use of rather rough interfaces [11.4, 5] to atomically flat areas [11.6], and imaginative adaptations of the Scanning Force Microscope (SFM) [11.7

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Reinier Beeuwkes Jr.imental measurements has become everday practice. Perturbation theory can bring the results of those calculations together and make predictions to the STM and SFM images. A consistency among the results from different approaches is a sign of true understanding. In words, a natural way of bringing va