Titlebook: Silicon Analog Components; Device Design, Proce Badih El-Kareh,Lou N. Hutter Textbook 2020Latest edition Springer Nature Switzerland AG 202

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Textbook 2020Latest editionssing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semico

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Chip Reliability,presented. The sections include dielectric reliability, electro and stress migration, hot-carrier reliability, latch-up, bias-temperature instabilities, Joule heating and resistor reliability, high-voltage and high-power MOSFET reliability, plasma damage, and electrostatic discharge.

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Analog/RF CMOS,sections that follow, with emphasis on key analog parameters. The chapter concludes with a review of mobility enhancement techniques, high-κ dielectrics, FinFETs, and fully depleted SOI MOSFETs and a brief discussion of analog CMOS applications.

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