Titlebook: Scanning Probe Microscopy; Electrical and Elect Sergei Kalinin,Alexei Gruverman Book 2007 Springer-Verlag New York 2007 AFM.KLTcatalog.Micr

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Introductionerate real-space images of surfaces with atomic resolution and has triggered development of new classes of STM-related techniques. In 1986, Binnig, Quate, and Gerber demonstrated atomic force microscope (AFM) based on the mechanical detection of the Van der Waals forces between the tip and the surfa

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Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics, which may be degraded near defects. This chapter will first review the history, principles, and modes of operation of the SCM. The remainder of the chapter will discuss major applications of scanning capacitance microscopy (.) for the electrical characterization of semiconductors and dielectric fi

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Frequency-Dependent Transport Imaging by Scanning Probe Microscopyance measurements (scanning impedance microscopy). Applying these two configurations, nanometer scale measurement and visualization of impedance is demonstrated for a wide variety of materials systems, including solid electrolytes, semiconductors, electroceramics, corrosion research, and fuel cell s

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Scanning Probe Measurements of Electron Transport in Moleculesld are used as a host two-dimensional matrix to isolate and to insulate electrically the molecular switches. We then individually address and electronically probe each molecule using STM. The conjugated molecules exhibit reversible conductance switching, manifested as a change in apparent topographi

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