Titlebook: Scanning Electron Microscopy and X-Ray Microanalysis; A Text for Biologist Joseph I. Goldstein,Dale E. Newbury,Eric Lifshin Book 1992Latest

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at expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage mic

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X-Ray Spectral Measurement: WDS and EDS,interactions, which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the methods for detecting and measuring these x rays as well as converting them into a useful form for qualitative and quantitative analysis.

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Compositional Imaging,in is nonspecific. That is, while the sequence of the average atomic numbers of the phases present can be recognized and classified by the relative gray levels in the image, that image conveys no specific information to identify the elements present or the concentration levels.

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Qualitative X-Ray Analysis,rs can arise unless careful attention is paid to the problems of spectral interferences, artifacts, and the multiplicity of spectral lines observed for each element. Because of the differences in approach to qualitative EDS and WDS analysis, these techniques will be treated separately.

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