| 书目名称 | Reliability of Nanoscale Circuits and Systems |
| 副标题 | Methodologies and Ci |
| 编辑 | Miloš Stanisavljević,Alexandre Schmid,Yusuf Lebleb |
| 视频video | http://file.papertrans.cn/827/826410/826410.mp4 |
| 概述 | Includes supplementary material: |
| 图书封面 |  |
| 描述 | This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components. |
| 出版日期 | Book 2011 |
| 关键词 | Averaging Design Implementations; Fault Models; Fault-Tolerant Approaches; Fault-Tolerant Architectures |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4419-6217-1 |
| isbn_softcover | 978-1-4899-8254-4 |
| isbn_ebook | 978-1-4419-6217-1 |
| copyright | Springer Science+Business Media, LLC 2011 |
|Archiver|手机版|小黑屋|
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