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Titlebook: Radiation Effects on Embedded Systems; RAOUL VELAZCO,PASCAL FOUILLAT,RICARDO REIS Book 2007 Springer Science+Business Media B.V. 2007 Radi

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Fernanda Lima Kastensmidt,Ricardo Reisary conditions as well as various numerical algorithms. The tests and applications proposed in this book can be performed on a standard PC..978-3-540-31518-6Series ISSN 0075-8450 Series E-ISSN 1616-6361
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Robert Ecoffetok as user friendly as possible, major supporting concepts and specialized tables are appended at the end of every chapter. In addition, each chapter concludes with a set of key terms and concepts, as well as a978-3-319-82770-4978-3-319-43252-6Series ISSN 0172-7397 Series E-ISSN 2197-568X
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Radiation Space Environment,well as protons from the Sun coronal mass ejection lead to total dose effects on electronic devices. Cosmic rays and heavy ions solar flares are responsible for heavy ions effects. In the first part of this paper, we will review these radiation effects. In the second part of this paper, we will addr
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Radiation Effects in Microelectronics, be exposed to a variety of energetic particles and photons. The resulting effects may be manifested as long-term parametric degradation or as transient changes in the state of the circuits. This paper presents an overview of these effects, emphasizing those device-level effects that are particularl
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