Titlebook: Nanoscale Characterisation of Ferroelectric Materials; Scanning Probe Micro Marin Alexe,Alexei Gruverman Book 2004 Springer-Verlag Berlin H

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1434-4904 ty is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com­ puter industry is turning to nanotechnology as a source of new processes and func­ tional materials, which can be used in high-performance high-density electronic systems. Rese

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Nanoscale Optical Probes of Ferroelectric Materials,that the piezoelectric response is large. Scanning measurements of linear [5]and nonlinear capacitance [6]can reveal the spatial distribution of dielectric properties, as can scanning microwave microscopy [7]. A review of AFM-based scanning probe techniques is found in Chap. 2.

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