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Titlebook: Nano-Optics; Satoshi Kawata,Motoichi Ohtsu,Masahiro Irie Book 2002 Springer-Verlag Berlin Heidelberg 2002 Apertur.Metall.Near-field optics

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N. Umeda,A. Yamamoto,R. Nishitani,J. Bae,T. Tanaka,S. Yamamotoman Catholic church it had become evident to those of his readers who were interested primarily in controversy that he was having the best of the matter. Newman, who had not read Gibbon for nothing, had been able to bring his gifts of irony and urbanity fully into play as he dealt with a charge that
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High-Resolution and High-Throughput Probes, are much smaller than the wavelength of the driving field [1,2]. It is apparent that fabricating and manipulating small antennas are the most important factors in the successful development of NOM. One of the most realistic and commonly used methods for preparating a small antenna is sharpening an
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Apertureless Near-Field Probes,n the configuration, the electric field localized near the tip of the sample is scattered by the fine structure of the sample or the tip and is detected with external collection optics. From the viewpoint of electromagnetism, the intensity of the scattered field detected in the far-field changes on
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Integrated and Functional Probes,ned probes with sharp tips, soft spring, and high resonant frequency were produced in a batch process for commercialization. In addition, using Si mi-cromachining which is compatible with Si integrated circuits, electronic func-tions for sensing and regulating the force acting on the tip have been i
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Near-Field Imaging of Quantum Devices and Photonic Structures,ese techniques do not possess the advantages of optical microscopy, such as nondestructiveness, low cost, and versatility. Therefore, the combination of the interactive mechanism of optical microscopy and the high spatial resolution of scanning probe methods is important, and NSOM was invented. This
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