| 书目名称 | Microelectronics Manufacturing Diagnostics Handbook | | 编辑 | Abraham H. Landzberg | | 视频video | | | 图书封面 |  | | 描述 | The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield an | | 出版日期 | Book 1993 | | 关键词 | diagnosis; manufacturing; material; reliability; semiconductor devices | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4615-2029-0 | | isbn_softcover | 978-1-4613-5840-4 | | isbn_ebook | 978-1-4615-2029-0 | | copyright | Springer Science+Business Media New York 1993 |
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发表于 2025-3-21 16:33:28
