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Titlebook: Microelectronic Systems; Circuits, Systems an Albert Heuberger,Günter Elst,Randolf Hanke Book 2011 Springer-Verlag Berlin Heidelberg 2011

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Ernst Eberlein,Jörn Thieleckeplinary fields.Provides insight into different areas of compThe Programme for International Student Assessment (PISA) is an important part of the OECD‘s Indicator Programme. It collects data and provides comparative indicators of education systems in OECD member and partner countries. PISA provides
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Marco Breiling,Albert Heuberger,Ernst Eberlein,Aharon Vargas,Daniel Arndt,Alexander Ihlowest in the PISA results rapidly declined. Nevertheless, there is sufficient reason to take a closer look at the PISA results, for instance because (a) our neighbours are catching up, (b) currently ambitious curriculum innovation programmes are being conducted in most of secondary education, and (c)
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Christian Forster,Nikolaus Färbern errors with unprecedented levels of detail. Translation error (TE) is defined as the lack of equivalence between the original and translated versions of items on multiple translation error dimensions (TEDs) that involve design, language, and content. According to the theory, TE results not only fr
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Bernhard Niemann,Thomas Heyn,Aharon Vargas,Sabino Titomanlio,Guillermo Grau,Ashweeni Beehareetions that target the poor and cover the entire poverty alleviation process and builds its analytical framework on this basis. It sums up targeted anti-poverty interventions in China from four aspects: identifying the poor and adjusting the register for changes in poverty status; poverty governance
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Advanced IC Design and Design Automation for Electronics and Heterogeneous Systemsich are used in many applications. Furthermore new ideas to apply modern manufacturing technology enable new sensor concepts. This paper summarizes the work of the Fraunhofer IIS in the field of design of electronic systems. Current challenges of design for manufacturability and reliability as well
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Electronic Design Automation for Implementation of 3D Integrated Systemsormance, less power consumption and lower cost. This paper addresses two challenges faced with the design using vertical integration. First, methods for the characterization of the physical behavior of the new interconnect structures are described. Second, since issues of reliability and thermal man
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