Titlebook: Microbeam and Nanobeam Analysis; Daniele Benoit,Jean-Francois Bresse,Johann Wernisc Conference proceedings 1996 Springer-Verlag Wien 1996

Intimidate

书目名称Microbeam and Nanobeam Analysis影响因子(影响力)




书目名称Microbeam and Nanobeam Analysis影响因子(影响力)学科排名




书目名称Microbeam and Nanobeam Analysis网络公开度




书目名称Microbeam and Nanobeam Analysis网络公开度学科排名




书目名称Microbeam and Nanobeam Analysis被引频次




书目名称Microbeam and Nanobeam Analysis被引频次学科排名




书目名称Microbeam and Nanobeam Analysis年度引用




书目名称Microbeam and Nanobeam Analysis年度引用学科排名




书目名称Microbeam and Nanobeam Analysis读者反馈




书目名称Microbeam and Nanobeam Analysis读者反馈学科排名

Spinal-Fusion

microscopic

Conspiracy

hyperuricemia

百灵鸟

theta-waves

https://doi.org/10.1007/978-3-7091-6555-3Absorption; Transmission; diffraction; electron microscope; electron microscopy; glass; imaging; microscopy

Phonophobia

妨碍议事

Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materi pre-existing point defects and induced defects during the electron bombardment. Examples of CL microscopy and spectroscopy applied to the microcharacterisation of semiconductors (GaAs, InP and related materials) and of synthetic and natural mineral materials (ZnS, SiO., rare-earth bearing crystals)

Anthrp

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)olymers) will be reviewed and illustrated. Different applications coming mainly from our recent work will be treated with special emphasis on imaging. They concern surface composition and morphology of polymer blends, contamination and additives at polymer surfaces, plasma treated polymer surfaces a