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Titlebook: Lead-Free Electronic Solders; A Special Issue of t K. N. Subramanian Book 2007 Springer-Verlag US 2007 Hardware.development.electronics.lea

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Compression stress-strain and creep properties of the 52In-48Sn and 97In-3Ag low-temperature Pb-frend optoelectronic (OE) devices. Stress-strain and creep studies, which provide solder mechanical properties for unified creep-plasticity (UCP) predictive models, were performed on the Pb-free 97In-3Ag (wt.%) and 58In-42Sn solders and counterpart Pb-bearing 80In-15Pb-5Ag and 70In-15Sn-9.6Pb-5.4Cd all
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Interfacial reaction issues for lead-free electronic solders, Sn-based solders and Cu have been studied for several decades, and currently there are still many un-resolved issues. The reactions between Sn-based solders and Ni are equally challenging. Recent studies further pointed out that Cu and Ni interacted strongly when they were both present in the same
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Mechanical fatigue of Sn-rich Pb-free solder alloys, softening, fatigue crack initiation, fatigue crack growth, and fatigue life behavior in these alloys. Because of their low melting temperatures, these alloys demonstrated extensive cyclic creep deformation at room temperature. Limited amount of data have shown that the cyclic creep rate is strongly
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Life expectancies of Pb-free SAC solder interconnects in electronic hardware,an Union. As a result, electronic manufacturers have sought a material comparable to the conventional 63Sn37Pb solder that has been traditionally used to assemble electronic hardware. Based on extensive review of various solder combination, the majority of electronic manufacturers appear to be adopt
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