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Titlebook: High-Speed Electronics; Basic Physical Pheno Bengt Källbäck,Heinz Beneking Conference proceedings 1986 Springer-Verlag Berlin Heidelberg 19

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楼主: Ensign
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Velocity Overshoot and Suppression of Diffusivity and Microwave Noise in Short n+-n-n+ Structures ofFast devices usually require semiconductors with high drift velocity of electrons and prefer the conditions of operation favourable for low noise and diffusivity.
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Novel Real-Space Transfer DevicesRecent results of studying novel, three-terminal, high-speed device based on the real-space hot electron transfer are presented. Two modes of operation of this device: the NERFET and the CHINT — for which the most impressive new data have been obtained, are discussed emphasizing the physics of their operation.
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Modelling of High Electron Velocity Effects for Devicesrt transit time of the electrons across the active region. The control currents have also to be high enough to cope with stray capacitances. In addition to these performances the devices must satisfy the absolute necessity of a reduced internal feedback and of low-impedance access zones.
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Mobility Overshoot of Hot Electronsobility of the hot carriers (photoinjected electrons and holes). For that purpose we resort to the use of the nonequilibrium statistical operator method (NSOM) in Zubarev’s approach [1], in the form already applied to the study of ultrafast relaxation phenomena in HEPS [2]. A nonlinear transport the
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Monte-Carlo Simulation of the Effects Induced by Real-Space Transfer in a HEMT. So, the device behavior is similar to MOST behavior if the large gap semiconductor upper layer is considered as an insulating layer. Nevertheless, the technology used to grow this layer allows for a greater interface quality than in the classical MOS transistor. Furthermore, non-stationary transpo
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