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Titlebook: Heterostructures on Silicon: One Step Further with Silicon; Yves I. Nissim,Emmanuel Rosencher Book 1989 Kluwer Academic Publishers 1989 Ep

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书目名称Heterostructures on Silicon: One Step Further with Silicon
编辑Yves I. Nissim,Emmanuel Rosencher
视频video
丛书名称NATO Science Series E:
图书封面Titlebook: Heterostructures on Silicon: One Step Further with Silicon;  Yves I. Nissim,Emmanuel Rosencher Book 1989 Kluwer Academic Publishers 1989 Ep
描述In the field of logic circuits in microelectronics, the leadership of silicon is now strongly established due to the achievement of its technology. Near unity yield of one million transistor chips on very large wafers (6 inches today, 8 inches tomorrow) are currently accomplished in industry. The superiority of silicon over other material can be summarized as follow: - The Si/Si0 interface is the most perfect passivating interface ever 2 obtained (less than 10" e y-I cm2 interface state density) - Silicon has a large thermal conductivity so that large crystals can be pulled. - Silicon is a hard material so that large wafers can be handled safely. - Silicon is thermally stable up to 1100°C so that numerous metallurgical operations (oxydation, diffusion, annealing ... ) can be achieved safely. - There is profusion of silicon on earth so that the base silicon wafer is cheap. Unfortunatly, there are fundamental limits that cannot be overcome in silicon due to material properties: laser action, infra-red detection, high mobility for instance. The development of new technologies of deposition and growth has opened new possibilities for silicon based structures. The well known properties
出版日期Book 1989
关键词Epitaxy; RHEED; Vakuuminjektionsverfahren; metal; optical properties; quantum wells; semiconductor; silicon
版次1
doihttps://doi.org/10.1007/978-94-009-0913-7
isbn_softcover978-94-010-6900-7
isbn_ebook978-94-009-0913-7Series ISSN 0168-132X
issn_series 0168-132X
copyrightKluwer Academic Publishers 1989
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0168-132X for instance. The development of new technologies of deposition and growth has opened new possibilities for silicon based structures. The well known properties 978-94-010-6900-7978-94-009-0913-7Series ISSN 0168-132X
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Heterostructures on Silicon: One Step Further with Silicon
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MBE Growth of GaAs and III–V Quantum Wells on Sirlattices and annealing on material quality. In-situ reflection high energy electron diffraction (RHEED) data has been correlated with ex-situ TEM and XRD structural data. A systematic study of photoluminescence properties of MQW’s on Si has also been carried out.
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