| 书目名称 | Advances in Electronic Testing | | 副标题 | Challenges and Metho | | 编辑 | Dimitris Gizopoulos | | 视频video | | | 概述 | First book that reviews a comprehensive set of advanced electronic testing topics.Hot" topics of current interest to test technology community has been selected.Authors are key contributors in the cor | | 丛书名称 | Frontiers in Electronic Testing | | 图书封面 |  | | 描述 | .Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey...The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex | | 出版日期 | Book 2006 | | 关键词 | Advances in Testing; CMOS; Electronic Circuits Testing; Hardware; Integrated Circuits; Microelectronics M | | 版次 | 1 | | doi | https://doi.org/10.1007/0-387-29409-0 | | isbn_softcover | 978-1-4899-8773-0 | | isbn_ebook | 978-0-387-29409-4Series ISSN 0929-1296 | | issn_series | 0929-1296 | | copyright | Springer-Verlag US 2006 |
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发表于 2025-3-21 16:46:21
