| 书目名称 | FIB Nanostructures | | 编辑 | Zhiming M. Wang | | 视频video | | | 概述 | Offers comprehensive coverage of novel nanostructures fabricated by focused ion beam.Provides the keys to understanding the emerging area of FIB nanostructures.Written by leading experts in each resea | | 丛书名称 | Lecture Notes in Nanoscale Science and Technology | | 图书封面 |  | | 描述 | .FIB Nanostructures .reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers‘ interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future | | 出版日期 | Book 2013 | | 关键词 | AFM Cantilever Calibration; Agmicro-Nanostructures; Deterministic Fabrication of Nanostructures FIB; Ep | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-319-02874-3 | | isbn_softcover | 978-3-319-37468-0 | | isbn_ebook | 978-3-319-02874-3Series ISSN 2195-2159 Series E-ISSN 2195-2167 | | issn_series | 2195-2159 | | copyright | Springer International Publishing Switzerland 2013 |
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发表于 2025-3-21 16:59:26
