| 书目名称 | Emerging Nanotechnologies |
| 副标题 | Test, Defect Toleran |
| 编辑 | Mohammad Tehranipoor |
| 视频video | |
| 概述 | Covers various technologies that have been suggested by researchers over the last decades.Includes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (Q |
| 丛书名称 | Frontiers in Electronic Testing |
| 图书封面 |  |
| 描述 | .Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality...Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.. |
| 出版日期 | Book 2008 |
| 关键词 | CMOS; Nanotechnologie; Nanotube; Technologie; carbon nanotubes; circuit; design; diagnosis; logic; nanotechno |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-0-387-74747-7 |
| isbn_softcover | 978-1-4419-4513-6 |
| isbn_ebook | 978-0-387-74747-7Series ISSN 0929-1296 |
| issn_series | 0929-1296 |
| copyright | Springer-Verlag US 2008 |
发表于 2025-3-21 16:16:11
