找回密码
 To register

QQ登录

只需一步,快速开始

扫一扫,访问微社区

Titlebook: Electronics Production Defects and Analysis; Oommen Tharakan Kuttiyil Thomas,Padma Padmanabhan Book 2022 The Editor(s) (if applicable) an

[复制链接]
查看: 50803|回复: 44
发表于 2025-3-21 16:40:50 | 显示全部楼层 |阅读模式
书目名称Electronics Production Defects and Analysis
编辑Oommen Tharakan Kuttiyil Thomas,Padma Padmanabhan
视频video
概述Captures defects encountered during various phases of fabrication of electronic packages.Includes over 229 live cases - well illustrated with photographs and their zoomed versions for easy understandi
丛书名称Springer Tracts in Electrical and Electronics Engineering
图书封面Titlebook: Electronics Production Defects and Analysis;  Oommen Tharakan Kuttiyil Thomas,Padma Padmanabhan  Book 2022 The Editor(s) (if applicable) an
描述.This book is a unique book capturing defects that are frequently encountered during various fabrication phases of electronic packages. These defects have been analyzed to their root cause and mitigation techniques and presented in the book. The book includes 228 cases with more than 480 color and magnified images of the defects. These defects are covered under eight subheads, viz soldering defects, PCB defects, mounting defects, conformal coating and potting defects, EEE component defects, workmanship defects, defects due to usage of non-FFF components, and defects in CAD layout. The possible reasons for the occurrence of the defects and the methods/practices by which they can be eliminated/mitigated have also been discussed. The chapter "mounting defects" shows the correct approach in the adjacent photograph, so that the users can refer to the right procedures. The book is helpful to those who are involved in the production of electronics packages to familiarize them with the different cases shown carefully and revised frequently. Exposure to the different defects is useful to all who are working in fabrication and quality control to realize a zero-defect product sans much time a
出版日期Book 2022
关键词High Reliability Electronics; Multiple Touch Up; Overcoat Peeled; Component Overhang; Barrel-Annular Rin
版次1
doihttps://doi.org/10.1007/978-981-16-9824-8
isbn_softcover978-981-16-9826-2
isbn_ebook978-981-16-9824-8Series ISSN 2731-4200 Series E-ISSN 2731-4219
issn_series 2731-4200
copyrightThe Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapor
The information of publication is updating

书目名称Electronics Production Defects and Analysis影响因子(影响力)




书目名称Electronics Production Defects and Analysis影响因子(影响力)学科排名




书目名称Electronics Production Defects and Analysis网络公开度




书目名称Electronics Production Defects and Analysis网络公开度学科排名




书目名称Electronics Production Defects and Analysis被引频次




书目名称Electronics Production Defects and Analysis被引频次学科排名




书目名称Electronics Production Defects and Analysis年度引用




书目名称Electronics Production Defects and Analysis年度引用学科排名




书目名称Electronics Production Defects and Analysis读者反馈




书目名称Electronics Production Defects and Analysis读者反馈学科排名




单选投票, 共有 1 人参与投票
 

0票 0.00%

Perfect with Aesthetics

 

1票 100.00%

Better Implies Difficulty

 

0票 0.00%

Good and Satisfactory

 

0票 0.00%

Adverse Performance

 

0票 0.00%

Disdainful Garbage

您所在的用户组没有投票权限
发表于 2025-3-21 20:31:20 | 显示全部楼层
Electronics Production Defects and Analysis978-981-16-9824-8Series ISSN 2731-4200 Series E-ISSN 2731-4219
发表于 2025-3-22 02:16:18 | 显示全部楼层
Socio-Markers and Information Transmissionvolved activity which comprises a multitude of tasks. Utmost attention shall be paid to each and every element and the respective production stage, in the process. This involves establishing after suitable validation soldering of miniscule electronic components, control on soldering of the paddle of
发表于 2025-3-22 06:22:39 | 显示全部楼层
发表于 2025-3-22 09:40:02 | 显示全部楼层
Bjoern Oest Hansen,Jan Taubert,Thomas Thielrapment leading to conductive anodic filament formation. Also, the PTH barrel integrity can be affected if the process control measures are not strictly followed. Moreover, the solderability of the PCBs can be impaired due to the formation of thick intermetallic compound on improper storage of the f
发表于 2025-3-22 16:16:33 | 显示全部楼层
Hinderk M. Emrich,Michael Wiegandthe defects arising due to offset in mounting of ICs, non-standard mounting of capacitors, damaged end termination of SMT devices, lead deformation on mounting of ICs, inadequate electrical clearance and improper lead formation. The case of mounting defect due to inadequate heel in ICs has been capt
发表于 2025-3-22 18:02:04 | 显示全部楼层
https://doi.org/10.1007/978-1-4614-8630-5nd shock environments. The commonly used conformal coating material and their applications are tabulated. Proper cleaning of the surfaces, masking the required areas including irregular surfaces with tapes and baking shall be strictly adhered to proscribe any defects. Three typical defects encounter
发表于 2025-3-22 21:49:09 | 显示全部楼层
发表于 2025-3-23 02:45:27 | 显示全部楼层
发表于 2025-3-23 08:54:49 | 显示全部楼层
Valeria De Bedout,Anna J. Nicholss can happen probably because of non-availability of equivalent devices and substituting with near equivalent ones which need not be form and fit although may be functionally equivalent. This results in issues such as failure to maintain adequate clearance between conductive elements, single point f
 关于派博传思  派博传思旗下网站  友情链接
派博传思介绍 公司地理位置 论文服务流程 影响因子官网 SITEMAP 大讲堂 北京大学 Oxford Uni. Harvard Uni.
发展历史沿革 期刊点评 投稿经验总结 SCIENCEGARD IMPACTFACTOR 派博系数 清华大学 Yale Uni. Stanford Uni.
|Archiver|手机版|小黑屋| 派博传思国际 ( 京公网安备110108008328) GMT+8, 2025-5-4 06:06
Copyright © 2001-2015 派博传思   京公网安备110108008328 版权所有 All rights reserved
快速回复 返回顶部 返回列表