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Titlebook: Developments in Applied Spectroscopy; Volume 7A Selected p E. L. Grove,Alfred J. Perkins Book 1969 Springer Science+Business Media New York

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楼主: 契约
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Spectroscopic Study of Hot Gasessity of volume emission of a given hot gas is presented and used, as well as the measured spectroscopic absorption coefficient. As in other branches of spectroscopy, the greatest emphasis has been placed on the measurement of spectral frequencies, because these frequencies are directly related to qu
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Dispersive and Nondispersive X-Ray Fluorescence Methods for the Measurement of the Thicknesses of Fiump and a diffusion pump. Attempts are being made to employ a high-speed turbo-molecular pump to produce the necessary vacuum. Such pumps have been claimed to produce higher vacuum than those of earlier types. The use of x-ray fluorescence seems to be the best method for the determination of thickne
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Application of X-Ray Topography to the Characterization of Semiconductor Surface Layersaluable information about structural perfection both in bulk and at the surface of crystals. X-ray diffraction topography is concerned with variations in the direction and/or intensities of x-rays that have been diffracted by crystals. From these variations the defect structure of the crystal may be
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Experience with a Computer-Coupled X-Ray Spectrometerorage of equations and constants for describing analytical systems where interelement effects are present. Two examples are discussed, one of which is analyzed by both theoretical and empirical approaches. In addition, use of mathematical functions to eliminate line interferences and the need for pu
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Use of Total Reflection at the Critical Angle for Dispersion of Ultrasoft X-Raysonnel of limited training. In search of simpler methods to overcome this barrier, the wavelength dependence for the critical angle of total reflection was investigated theoretically and scouted experimentally. Development of an x-ray spectrograph for the routine analysis of light elements is encoura
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