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SCIE期刊MICROELECTRONICS RELIABILITY 2024/2025影响因子:1.672 (MICROELECTRON RELIAB) (0026-2714). (NANOSCIENCE & NANOTECHNOLOG

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发表于 2025-3-21 19:08:15 | 显示全部楼层 |阅读模式
期刊全称MICROELECTRONICS RELIABILITY
期刊简称MICROELECTRON RELIAB
影响因子20241.672
视频videohttp://file.papertrans.cn/22/21932/21932.mp4
ISSN0026-2714
eISSN1872-941X
出版商PERGAMON-ELSEVIER SCIENCE LTD
发行地址THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB
学科分类1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic | Nanoscience & Nanotechnology | Physics, Applied; 2.Current Contents Electronics & Telecommunications Collection--Electronics & Electrical Engineering; 3.Current Contents Engineering, Computing & Technology--Electrical & Electronics Engineering; 4.Essential Science Indicators--Engineering;
出版语言English
The information of publication is updating

SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)影响因子@(纳米科学与纳米技术)学科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)总引论文


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引论文@(纳米科学与纳米技术)学科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子


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SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)即时影响因子


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SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)五年累积影响因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)五年累积影响因子@(纳米科学与纳米技术)学科排名


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发表于 2025-3-22 01:10:20 | 显示全部楼层
Submitted on: 17 January 2010. Revised on: 25 February 2010. Accepted on: 03 March 2010. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
exceptional
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发表于 2025-3-22 11:53:40 | 显示全部楼层
Submitted on: 28 April 2020. Revised on: 20 May 2020. Accepted on: 03 June 2020. MICROELECTRONICS RELIABILITY
细节
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发表于 2025-3-22 15:25:00 | 显示全部楼层
Submitted on: 20 February 2017. Revised on: 14 March 2017. Accepted on: 22 March 2017. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
carotenoids
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发表于 2025-3-22 18:32:12 | 显示全部楼层
Submitted on: 19 September 2000. Revised on: 17 October 2000. Accepted on: 12 November 2000. MICROELECTRONICS RELIABILITY
嫌恶
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发表于 2025-3-22 22:10:17 | 显示全部楼层
Submitted on: 04 June 2015. Revised on: 03 July 2015. Accepted on: 29 July 2015. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
Tailor
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发表于 2025-3-23 04:06:29 | 显示全部楼层
Submitted on: 04 January 2001. Revised on: 31 January 2001. Accepted on: 09 February 2001. MICROELECTRONICS RELIABILITY
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发表于 2025-3-23 06:35:55 | 显示全部楼层
Submitted on: 08 October 2018. Revised on: 08 November 2018. Accepted on: 29 November 2018. MICROELECTRONICS RELIABILITY
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