Titlebook: Applied Scanning Probe Methods I; Bharat Bhushan,Harald Fuchs,Sumio Hosaka Book 2004 Springer-Verlag Berlin Heidelberg 2004 AFM.Material S

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Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Processor reproducibility of their characteristics. In this paper we describe the operation of the room-temperature single-electron memory fabricated using the atomic force microscopy (AFM) nano-oxidation process [4–6].

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Sensor Technology for Scanning Probe Microscopyeashed the development of a new class of analytical tools that revolutionized surface science during the last two decades. The capability to study various surface properties on an atomic scale [5] coupled with the capability to manipulate or arrange molecular structures [6, 7] has blossomed into wha

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Titlebook: Applied Scanning Probe Methods I; Bharat Bhushan,Harald Fuchs,Sumio Hosaka Book 2004 Springer-Verlag Berlin Heidelberg 2004 AFM.Material S

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