SCIE期刊IEEE Design & Test 2024/2025影响因子:1.909 (IEEE DES TEST) (2168-2356). (ENGINEERING, ELECTRICAL & ELECTRONIC)(工程，电气和

贪污

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影响因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)影响因子@(工程，电气和电子)学科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)总引论文


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)总引论文@(工程，电气和电子)学科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影响因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)总引频次@(工程，电气和电子)学科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)即时影响因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)即时影响因子@(工程，电气和电子)学科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)五年累积影响因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)五年累积影响因子@(工程，电气和电子)学科排名

使熄灭

COMA

inquisitive

Submitted on: 11 November 2021. Revised on: 03 March 2022. Accepted on: 19 March 2022. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Exonerate

蒸发

Submitted on: 05 January 2003. Revised on: 07 April 2003. Accepted on: 30 April 2003. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

禁止,切断

Abrade

Submitted on: 01 January 2003. Revised on: 30 April 2003. Accepted on: 07 June 2003. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

APRON

渐强

Submitted on: 18 July 2016. Revised on: 25 August 2016. Accepted on: 06 September 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC