ALLY 发表于 2025-3-21 18:32:34

书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications影响因子(影响力)<br>        http://impactfactor.cn/if/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications影响因子(影响力)学科排名<br>        http://impactfactor.cn/ifr/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications网络公开度<br>        http://impactfactor.cn/at/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications网络公开度学科排名<br>        http://impactfactor.cn/atr/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications被引频次<br>        http://impactfactor.cn/tc/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications被引频次学科排名<br>        http://impactfactor.cn/tcr/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications年度引用<br>        http://impactfactor.cn/ii/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications年度引用学科排名<br>        http://impactfactor.cn/iir/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications读者反馈<br>        http://impactfactor.cn/5y/?ISSN=BK0826408<br><br>        <br><br>书目名称Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications读者反馈学科排名<br>        http://impactfactor.cn/5yr/?ISSN=BK0826408<br><br>        <br><br>

干旱 发表于 2025-3-21 21:34:31

Conclusions and Perspectives,In this final Chapter, a high level summary of the main results presented in the previous Chapters is given. Perspectives for future studies of similar technologies are also outlined.

形容词 发表于 2025-3-22 03:12:18

http://reply.papertrans.cn/83/8265/826408/826408_3.png

贪婪性 发表于 2025-3-22 06:21:22

http://reply.papertrans.cn/83/8265/826408/826408_4.png

全等 发表于 2025-3-22 10:49:10

http://reply.papertrans.cn/83/8265/826408/826408_5.png

Myosin 发表于 2025-3-22 15:49:31

http://reply.papertrans.cn/83/8265/826408/826408_6.png

A简洁的 发表于 2025-3-22 18:11:56

http://reply.papertrans.cn/83/8265/826408/826408_7.png

密码 发表于 2025-3-22 23:58:45

http://reply.papertrans.cn/83/8265/826408/826408_8.png

aesthetic 发表于 2025-3-23 02:08:26

http://reply.papertrans.cn/83/8265/826408/826408_9.png

WAIL 发表于 2025-3-23 08:25:36

http://reply.papertrans.cn/83/8265/826408/826408_10.png
页: [1] 2 3 4
查看完整版本: Titlebook: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications; Jacopo Franco,Ben Kaczer,Guido Groeseneken Book 2014 Sprin