GLOAT
发表于 2025-3-21 18:26:32
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COUCH
发表于 2025-3-21 23:11:57
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不幸的人
发表于 2025-3-22 02:43:20
Increasing the Reliability of Device/Product Designs,Design engineers are continually asked reliability questions such as: (1) . Often the designer will attempt to answer these questions by stating a . which was used for a design
extinguish
发表于 2025-3-22 07:23:51
J.W. McPhersonProvides basic Reliability Physics and Engineering tools for Electrical Engineers, Mechanical Engineers, Materials Scientists, and Applied Physicists to build better products.Includes information for
拔出
发表于 2025-3-22 11:44:27
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minimal
发表于 2025-3-22 13:43:01
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取之不竭
发表于 2025-3-22 19:20:57
Failure Rate Modeling, expected failure rate will be an important indicator of future warranty liability. For the customer, the expected failure rate will be an important indicator of future satisfaction. For . applications, it is of paramount importance for one to know that the expected failure rate will be extremely low.
Pudendal-Nerve
发表于 2025-3-22 23:47:35
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Immortal
发表于 2025-3-23 04:43:00
https://doi.org/10.1007/978-1-4419-6348-2Burnin and Defect Elimination; Failure Rate Reduction; Time-To; Time-To-Failure Modeling; design; develop
Diastole
发表于 2025-3-23 05:41:02
J.W. McPhersonThe main result is that for small values of Ac, defined as the (experimentally controllable) jump in mole fraction of solute at the triple junction, the growth velocity of the trailing grain is approximately proportional to (Ac)., but for large positive Ac the velocity is approximately proportional