invade 发表于 2025-3-26 23:57:45

Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering,th of the materials. Important crystalline defects such as vacancies, dislocations, and grain boundaries are discussed. These crystalline defects can play critically important roles as time-to-failure models are developed for: creep, fatigue, crack propagation, thermal expansion mismatch, corrosion and stress-corrosion cracking.

Flu表流动 发表于 2025-3-27 03:42:13

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Lipoprotein 发表于 2025-3-27 08:28:16

Textbook 20101st editioneering po- tion, you will be asked — how long is your newly developed device expected to last? This text was designed to help you to answer this fundamentally important question. All materials and devices are expected to degrade with time, so it is very natural to ask — how long will the product las

Minatory 发表于 2025-3-27 10:05:27

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Ophthalmologist 发表于 2025-3-27 17:40:20

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种族被根除 发表于 2025-3-27 19:28:07

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统治人类 发表于 2025-3-27 23:00:05

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arthroplasty 发表于 2025-3-28 05:14:49

Introduction, automobile tires) are fabricated from materials that will tend to degrade with time. The . will continue until some critical device parameter can no longer meet the required specification for proper device functionality. At this point, one usually says: the device has failed. This failure could be

进入 发表于 2025-3-28 09:42:13

Materials and Device Degradation,idence for degradation is apparently everywhere in nature. A fresh coating of paint on a house will eventually crack and peel. The finish on a new automobile will oxidize with time. The tight tolerances associated with finely meshed gears will deteriorate with time. The critical parameters associate

薄荷醇 发表于 2025-3-28 11:29:41

From Material/Device Degradation to Time-To-Failure,thods were presented in Chapter 2 which can be used for modeling the time-dependence of degradation. The question that we would like to address in this chapter is --- .? The time-to-failure equations are critically important, for device failure-mechanisms, and will be the focus of the remaining chap
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查看完整版本: Titlebook: Reliability Physics and Engineering; Time-To-Failure Mode J.W. McPherson Textbook 20101st edition Springer Science+Business Media, LLC 2010