威风
发表于 2025-3-21 16:35:59
书目名称Rapid Thermal Processing of Semiconductors影响因子(影响力)<br> http://impactfactor.cn/2024/if/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors影响因子(影响力)学科排名<br> http://impactfactor.cn/2024/ifr/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors网络公开度<br> http://impactfactor.cn/2024/at/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors网络公开度学科排名<br> http://impactfactor.cn/2024/atr/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors被引频次<br> http://impactfactor.cn/2024/tc/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors被引频次学科排名<br> http://impactfactor.cn/2024/tcr/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors年度引用<br> http://impactfactor.cn/2024/ii/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors年度引用学科排名<br> http://impactfactor.cn/2024/iir/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors读者反馈<br> http://impactfactor.cn/2024/5y/?ISSN=BK0821222<br><br> <br><br>书目名称Rapid Thermal Processing of Semiconductors读者反馈学科排名<br> http://impactfactor.cn/2024/5yr/?ISSN=BK0821222<br><br> <br><br>
休闲
发表于 2025-3-21 20:41:43
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煤渣
发表于 2025-3-22 00:46:58
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凶猛
发表于 2025-3-22 08:02:17
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修饰
发表于 2025-3-22 12:04:38
978-1-4899-1806-2Springer Science+Business Media New York 1997
comely
发表于 2025-3-22 15:56:20
Recrystallization of Implanted Layers and Impurity Behavior in Silicon Crystals,or in silicon are presented and discussed. In particular, the distinct features based on the nonequilibrium conditions created in RTP are emphasized. These phenomena have been investigated for the most part in the solid state for silicon.
Chauvinistic
发表于 2025-3-22 19:57:03
Rapid Thermal Oxidation and Nitridation,e oxide thickness decreases and the gate capacitance increases. In EEPROMs Fowler-Nordheim (FN) tunneling current, which is used to charge and discharge the gate of the memory cell, can slowly degrade the gate dielectric properties through trapped charges in the gate dielectric. The resultant shift
多嘴多舌
发表于 2025-3-22 22:47:33
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RACE
发表于 2025-3-23 04:56:14
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截断
发表于 2025-3-23 06:53:44
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