mobility
发表于 2025-3-21 17:41:36
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可转变
发表于 2025-3-21 23:33:28
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分散
发表于 2025-3-22 02:43:17
At-speed Test Challenges for Nanometer Technology Designs,wer scan design and pattern generation. Test data run over many dice and wafers can provide valuable diagnostic information that helps foundries and designers ramp up their yields. In this sense, DFT meets DFM and becomes a critical element in the attempt to mitigate process variability.
Foolproof
发表于 2025-3-22 04:59:43
Hybrid Scan-Based Transition Delay Test,, in industry, is often called LOS+LOC. It provides a fault coverage higher than that of LOS but the design effort still remains high since the scan enable to all scan chains must be timing closed because of using LOS method.
Mercurial
发表于 2025-3-22 09:38:09
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POLYP
发表于 2025-3-22 13:44:05
Avoiding Functionally Untestable Faults,t coverage by increasing the chance of detecting non-modeled faults or filled by compression tools to obtain the highest compression to reduce test data volume and test time. However, filling these don‘t-care bits without considering the functionally untestable faults can cause yield loss.
凹室
发表于 2025-3-22 18:42:25
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吃掉
发表于 2025-3-22 23:24:13
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Carcinoma
发表于 2025-3-23 03:35:29
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黑豹
发表于 2025-3-23 09:28:09
Screening Small Delay Defects,ts. Resistive open and short are two such defects that cause timing or logic failures in the design. Such defects can cause gross or small delay defects depending on the size of their resistance. It is proven that the population of such defects increases as technology scales, thus increasing small delay defects.