CROW 发表于 2025-3-26 21:01:09

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菊花 发表于 2025-3-27 01:58:31

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expansive 发表于 2025-3-27 07:03:10

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Magnificent 发表于 2025-3-27 11:06:54

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荧光 发表于 2025-3-27 14:00:12

Grundlagen der doppelten Buchführung properties of SOI materials. Even after complete processing of integrated circuits, the interface quality and some of the crystalline imperfections of the incipient SOI wafer are still transparent in transistor characteristics.

Adj异类的 发表于 2025-3-27 19:10:50

Transistor-Based Characterization Techniques, properties of SOI materials. Even after complete processing of integrated circuits, the interface quality and some of the crystalline imperfections of the incipient SOI wafer are still transparent in transistor characteristics.

precede 发表于 2025-3-27 23:50:49

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Inveterate 发表于 2025-3-28 05:14:15

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DIKE 发表于 2025-3-28 09:43:20

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先行 发表于 2025-3-28 14:03:10

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查看完整版本: Titlebook: Electrical Characterization of Silicon-on-Insulator Materials and Devices; Sorin Cristoloveanu,Sheng S. Li Book 1995 Springer Science+Busi