whiplash 发表于 2025-3-21 19:56:39

书目名称Ageing of Integrated Circuits影响因子(影响力)<br>        http://figure.impactfactor.cn/if/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits影响因子(影响力)学科排名<br>        http://figure.impactfactor.cn/ifr/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits网络公开度<br>        http://figure.impactfactor.cn/at/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits网络公开度学科排名<br>        http://figure.impactfactor.cn/atr/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits被引频次<br>        http://figure.impactfactor.cn/tc/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits被引频次学科排名<br>        http://figure.impactfactor.cn/tcr/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits年度引用<br>        http://figure.impactfactor.cn/ii/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits年度引用学科排名<br>        http://figure.impactfactor.cn/iir/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits读者反馈<br>        http://figure.impactfactor.cn/5y/?ISSN=BK0151049<br><br>        <br><br>书目名称Ageing of Integrated Circuits读者反馈学科排名<br>        http://figure.impactfactor.cn/5yr/?ISSN=BK0151049<br><br>        <br><br>

大量杀死 发表于 2025-3-21 21:16:26

http://reply.papertrans.cn/16/1511/151049/151049_2.png

Intrepid 发表于 2025-3-22 03:44:42

Critique and Its Postnational Aftermath The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error

Lobotomy 发表于 2025-3-22 08:02:43

http://reply.papertrans.cn/16/1511/151049/151049_4.png

linear 发表于 2025-3-22 10:18:35

http://reply.papertrans.cn/16/1511/151049/151049_5.png

GLIDE 发表于 2025-3-22 15:49:28

http://reply.papertrans.cn/16/1511/151049/151049_6.png

模仿 发表于 2025-3-22 17:46:05

http://reply.papertrans.cn/16/1511/151049/151049_7.png

ciliary-body 发表于 2025-3-23 00:15:01

Ageing Mitigation Techniques for SRAM Memories The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error

puzzle 发表于 2025-3-23 03:24:13

http://reply.papertrans.cn/16/1511/151049/151049_9.png

故意钓到白杨 发表于 2025-3-23 06:52:17

http://reply.papertrans.cn/16/1511/151049/151049_10.png
页: [1] 2 3 4 5
查看完整版本: Titlebook: Ageing of Integrated Circuits; Causes, Effects and Basel Halak Book 2020 Springer Nature Switzerland AG 2020 Analog IC Reliability.Aging E