钢笔尖
发表于 2025-3-26 23:32:32
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清醒
发表于 2025-3-27 05:00:16
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恶意
发表于 2025-3-27 08:37:18
Critique and Its Postnational Aftermathents of digital circuits is crucial, in particular, in static random-access memory (SRAM) as it is always subject to ageing for whatever value is stored in an SRAM cell. Moreover, the prolonged storage of the same bit patterns in an SRAM can cause asymmetric NBTI stress, which is manifested by the t
护航舰
发表于 2025-3-27 13:05:42
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optional
发表于 2025-3-27 15:27:58
Philipp S. Müller,Markus Ledererand performance monitors have become necessary for adaptive compensation schemes. This chapter presents up-to-date state-of-the-art performance and reliability monitors, insertion methodology and experimental results of different monitors used for process and environment variations as well as ageing
A简洁的
发表于 2025-3-27 19:32:14
https://doi.org/10.1057/9781403979513o various aging mechanisms. Bias temperature instability (BTI) and hot carrier injection (HCI) phenomena are highly accused of the aging-related reliability reduction. This degradation is getting worse under excess stress conditions (high operating temperature and voltage levels). Aging phenomena si
Dignant
发表于 2025-3-28 00:16:40
Gene Callahan,Kenneth B. McIntyreS device will degrade significantly over time and, therefore, results in the delay faults. In situ delay fault monitoring schemes have been proposed to ensure the reliability of an IC during its lifetime. Such schemes are usually based on the application of ageing sensors to predict ageing-induced f
BYRE
发表于 2025-3-28 02:11:19
Basel HalakDescribes in detail the physical mechanisms of CMOS ageing.Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits.Presents state-of-the art s
山羊
发表于 2025-3-28 08:41:56
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hyperuricemia
发表于 2025-3-28 11:03:36
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