贪污
发表于 2025-3-21 16:19:36
SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影响因子<br> http://figure.impactfactor.cn/if/?ISSN=2168-2356<br><br> SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)影响因子@(工程,电气和电子)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=2168A2356<br><br> SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)总引论文<br> http://figure.impactfactor.cn/at/?ISSN=2168-2356<br><br> SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)总引论文@(工程,电气和电子)学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=2168A2356<br><br> SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影响因子<br> http://figure.impactfactor.cn/tc/?ISSN=2168-2356<br><br> SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)总引频次@(工程,电气和电子)学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=2168A2356<br><br> SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)即时影响因子<br> http://figure.impactfactor.cn/ii/?ISSN=2168-2356<br><br> SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)即时影响因子@(工程,电气和电子)学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=2168A2356<br><br> SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)五年累积影响因子<br> http://figure.impactfactor.cn/5y/?ISSN=2168-2356<br><br> SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)五年累积影响因子@(工程,电气和电子)学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=2168A2356<br><br>
使熄灭
发表于 2025-3-21 20:41:58
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COMA
发表于 2025-3-22 03:17:59
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inquisitive
发表于 2025-3-22 05:38:08
Submitted on: 11 November 2021.
Revised on: 03 March 2022.
Accepted on: 19 March 2022.
___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Exonerate
发表于 2025-3-22 10:25:09
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蒸发
发表于 2025-3-22 14:52:59
Submitted on: 05 January 2003.
Revised on: 07 April 2003.
Accepted on: 30 April 2003.
___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
禁止,切断
发表于 2025-3-22 20:43:59
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Abrade
发表于 2025-3-22 22:19:05
Submitted on: 01 January 2003.
Revised on: 30 April 2003.
Accepted on: 07 June 2003.
___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
APRON
发表于 2025-3-23 04:20:07
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渐强
发表于 2025-3-23 06:21:43
Submitted on: 18 July 2016.
Revised on: 25 August 2016.
Accepted on: 06 September 2016.
___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC